Yiming Qu, Yang Shen, Mingji Su, Jiwu Lu, Yi Zhao. GHz C-V Characterization Methodology and Its Application for Understanding Polarization Behaviors in High-k Dielectric Films. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 3, IEEE, 2022. [doi]
Abstract is missing.