Real-Time In-situ Monitoring and Characterization of Production Wafer Probing Process - researchr publication authors

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Minh Quach, Kim Harper. Real-Time In-situ Monitoring and Characterization of Production Wafer Probing Process. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 802-808, IEEE Computer Society, 1997.

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