Minh Quach, Kim Harper. Real-Time In-situ Monitoring and Characterization of Production Wafer Probing Process. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 802-808, IEEE Computer Society, 1997.
@inproceedings{QuachH97,
title = {Real-Time In-situ Monitoring and Characterization of Production Wafer Probing Process},
author = {Minh Quach and Kim Harper},
year = {1997},
tags = {process monitoring},
researchr = {https://researchr.org/publication/QuachH97},
cites = {0},
citedby = {0},
pages = {802-808},
booktitle = {Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997},
publisher = {IEEE Computer Society},
isbn = {0-7803-4209-7},
}