Kien Trinh Quang, Sergio Ruocco, Massimo Alioto. Modeling the impact of dynamic voltage scaling on 1T-1J STT-RAM write energy and performance. In 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015. pages 2313-2316, IEEE, 2015. [doi]
Abstract is missing.