Bruce Querbach, Sudeep Puligundla, Daniel Becerra, Zale T. Schoenborn, Patrick Chiang. Comparison of hardware based and software based stress testing of memory IO interface. In IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013, Columbus, OH, USA, August 4-7, 2013. pages 637-640, IEEE, 2013. [doi]
@inproceedings{QuerbachPBSC13,
title = {Comparison of hardware based and software based stress testing of memory IO interface},
author = {Bruce Querbach and Sudeep Puligundla and Daniel Becerra and Zale T. Schoenborn and Patrick Chiang},
year = {2013},
doi = {10.1109/MWSCAS.2013.6674729},
url = {https://doi.org/10.1109/MWSCAS.2013.6674729},
researchr = {https://researchr.org/publication/QuerbachPBSC13},
cites = {0},
citedby = {0},
pages = {637-640},
booktitle = {IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013, Columbus, OH, USA, August 4-7, 2013},
publisher = {IEEE},
}