Bruce Querbach, Sudeep Puligundla, Daniel Becerra, Zale T. Schoenborn, Patrick Chiang. Comparison of hardware based and software based stress testing of memory IO interface. In IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013, Columbus, OH, USA, August 4-7, 2013. pages 637-640, IEEE, 2013. [doi]
Abstract is missing.