Bruce Querbach, Tan Peter Yanyang, Lovelace Van, David Blankenbeckler, Rahul Khanna, Sudeep Puligundla, Patrick Chiang. Platform IO and system memory test using L3 cache based test (CBT) and parallel execution of CPGC Intel BIST engine. In 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015. pages 1-10, IEEE, 2015. [doi]
Abstract is missing.