Rafael Quintanilla, John T. Wen, Murat Arcak, Joe Frankel, Mark Peeples, Mark Unrath. Robust Control for Linear Stages in Electronic Manufacturing. In American Control Conference, ACC 2007, New York, NY, USA, 9-13 July, 2007. pages 1269-1274, IEEE, 2007. [doi]
@inproceedings{QuintanillaWAFP07,
title = {Robust Control for Linear Stages in Electronic Manufacturing},
author = {Rafael Quintanilla and John T. Wen and Murat Arcak and Joe Frankel and Mark Peeples and Mark Unrath},
year = {2007},
doi = {10.1109/ACC.2007.4282545},
url = {https://doi.org/10.1109/ACC.2007.4282545},
researchr = {https://researchr.org/publication/QuintanillaWAFP07},
cites = {0},
citedby = {0},
pages = {1269-1274},
booktitle = {American Control Conference, ACC 2007, New York, NY, USA, 9-13 July, 2007},
publisher = {IEEE},
}