Moinuddin K. Qureshi, John Karidis, Michele Franceschini, Vijayalakshmi Srinivasan, Luis Lastras, Bülent Abali. Enhancing lifetime and security of PCM-based main memory with start-gap wear leveling. In David H. Albonesi, Margaret Martonosi, David I. August, José MartÃnez, editors, 42st Annual IEEE/ACM International Symposium on Microarchitecture (MICRO-42 2009), December 12-16, 2009, New York, New York, USA. pages 14-23, ACM, 2009. [doi]
Abstract is missing.