Kaamran Raahemifar, Majid Ahmadi. Fault Characterizations and Design-for-Testability Technique for Detecting I::DDQ:: Faults in CMOS/BiCMOS Circuits. In Proceedings of the 38th Design Automation Conference, DAC 2001, Las Vegas, NV, USA, June 18-22, 2001. pages 313-316, ACM, 2001. [doi]
Abstract is missing.