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Reducing Cost of Yield Enhancement in 3-D Stacked Memories Via Asymmetric Layer Repair Capability

Muhammad Tauseef Rab, Asad Amin Bawa, Nur A. Touba. Reducing Cost of Yield Enhancement in 3-D Stacked Memories Via Asymmetric Layer Repair Capability. IEEE Trans. VLSI Syst., 22(9):2017-2024, 2014. [doi]

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Muhammad Tauseef Rab

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Asad Amin Bawa

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Nur A. Touba

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