Reducing Cost of Yield Enhancement in 3-D Stacked Memories Via Asymmetric Layer Repair Capability

Muhammad Tauseef Rab, Asad Amin Bawa, Nur A. Touba. Reducing Cost of Yield Enhancement in 3-D Stacked Memories Via Asymmetric Layer Repair Capability. IEEE Trans. VLSI Syst., 22(9):2017-2024, 2014. [doi]

Abstract

Abstract is missing.