Stress-Lysis: A DNN-Integrated Edge Device for Stress Level Detection in the IoMT - researchr publication authors

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Laavanya Rachakonda, Saraju P. Mohanty, Elias Kougianos, Prabha Sundaravadivel. Stress-Lysis: A DNN-Integrated Edge Device for Stress Level Detection in the IoMT. IEEE Trans. Consumer Electronics, 65(4):474-483, 2019. [doi]

This author has not been identified. Look up 'Laavanya Rachakonda' in GoogleThis author has not been identified. Look up 'Saraju P. Mohanty' in GoogleThis author has not been identified. Look up 'Elias Kougianos' in GoogleThis author has not been identified. Look up 'Prabha Sundaravadivel' in Google

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