Laavanya Rachakonda, Saraju P. Mohanty, Elias Kougianos, Prabha Sundaravadivel. Stress-Lysis: A DNN-Integrated Edge Device for Stress Level Detection in the IoMT. IEEE Trans. Consumer Electronics, 65(4):474-483, 2019. [doi]
@article{RachakondaMKS19,
title = {Stress-Lysis: A DNN-Integrated Edge Device for Stress Level Detection in the IoMT},
author = {Laavanya Rachakonda and Saraju P. Mohanty and Elias Kougianos and Prabha Sundaravadivel},
year = {2019},
doi = {10.1109/TCE.2019.2940472},
url = {https://doi.org/10.1109/TCE.2019.2940472},
researchr = {https://researchr.org/publication/RachakondaMKS19},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Consumer Electronics},
volume = {65},
number = {4},
pages = {474-483},
}