M. K. Radhakrishnan. Device Reliability and Failure Mechanisms Related to Gate Dielectrics and Interconnects. In 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India. pages 805-808, IEEE Computer Society, 2004. [doi]
@inproceedings{Radhakrishnan04:0, title = {Device Reliability and Failure Mechanisms Related to Gate Dielectrics and Interconnects}, author = {M. K. Radhakrishnan}, year = {2004}, url = {http://csdl.computer.org/comp/proceedings/vlsid/2004/2072/00/20720805.pdf}, tags = {reliability}, researchr = {https://researchr.org/publication/Radhakrishnan04%3A0}, cites = {0}, citedby = {0}, pages = {805-808}, booktitle = {17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India}, publisher = {IEEE Computer Society}, isbn = {0-7695-2072-3}, }