M. K. Radhakrishnan. Device Reliability and Failure Mechanisms Related to Gate Dielectrics and Interconnects. In 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India. pages 805-808, IEEE Computer Society, 2004. [doi]
Abstract is missing.