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An Automated Measurement System for the Characterization of Electron Device Degradation Under Nonlinear Dynamic Regime

Antonio Raffo, Valeria Di Giacomo, Pier Andrea Traverso, Alberto Santarelli, Giorgio Vannini. An Automated Measurement System for the Characterization of Electron Device Degradation Under Nonlinear Dynamic Regime. IEEE T. Instrumentation and Measurement, 58(8):2663-2670, 2009. [doi]

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