Antonio Raffo - researchr alias

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Viewing Publication 1 - 19 from 19

2024

Theoretical and Experimental Analysis of a CSWPL Behavioral Model for Microwave GaN Transistors Including DC Bias VoltagesXiaoqiang Tang, Antonio Raffo, Nicola Donato, Giovanni Crupi, Jialin Cai. tcad, 43(3):933-943, March 2024. [doi]

2023

GaN HEMT Small-Signal Modeling Using an Optimization Strategy Based on Gated Recurrent Unit NetworksJialin Cai, Giovanni Gugliandolo, Zlatica Marinkovic, Mariangela Latino, Enza Fazio, Gianni Bosi, Antonio Raffo, Giovanni Crupi, Nicola Donato. metroxraine 2023: 422-426 [doi]

2022

Analysis of Efficiency-Limiting Factors Resulting from Transistor Current Source on Class-F and Inverse Class-F Power AmplifiersHiroshi Yamamoto, Ken Kikuchi, Valeria Vadalà, Gianni Bosi, Antonio Raffo, Giorgio Vannini. ieicetc, 105-C(10):449-456, October 2022. [doi]

2018

2017

Impact of transistor model uncertainty on microwave load-pull simulationsGianni Bosi, Antonio Raffo, Giorgio Vannini, Gustavo Avolio, Dominique Schreurs. i2mtc 2017: 1-6 [doi]

Software Defined Doppler Radar as a Contactless Multipurpose Microwave Sensor for Vibrations MonitoringAntonio Raffo, Sandra Costanzo, Giuseppe Di Massa. sensors, 17(1):115, 2017. [doi]

Doppler Elaboration for Vibrations Detection Using Software Defined RadarAntonio Raffo, Sandra Costanzo. worldcist 2017: 1022-1028 [doi]

2016

Environmental Effects on the Performances of a UHF Passive Tag-Based Commercial RFID SystemSandra Costanzo, Antonio Costanzo, Antonio Raffo, Antonio Borgia. worldcist 2016: 317-323 [doi]

Software-Defined Radar System for Landslides MonitoringSandra Costanzo, Giuseppe Di Massa, Antonio Costanzo, Antonio Borgia, Antonio Raffo, Giuseppe Viggiani, Pasquale Versace. worldcist 2016: 325-331 [doi]

2015

2011

A dual-source nonlinear measurement system oriented to the empirical characterization of low-frequency dispersion in microwave electron devicesAntonio Raffo, Valeria Vadalà, Pier Andrea Traverso, Alberto Santarelli, Giorgio Vannini, Fabio Filicori. csi, 33(2):165-175, 2011. [doi]

Analysis of the gate current as a suitable indicator for FET degradation under nonlinear dynamic regimeAntonio Raffo, Sergio Di Falco, Giovanna Sozzi, Roberto Menozzi, Dominique M. M.-P. Schreurs, Giorgio Vannini. mr, 51(2):235-239, 2011. [doi]

2009

An Automated Measurement System for the Characterization of Electron Device Degradation Under Nonlinear Dynamic RegimeAntonio Raffo, Valeria Di Giacomo, Pier Andrea Traverso, Alberto Santarelli, Giorgio Vannini. tim, 58(8):2663-2670, 2009. [doi]

2006

Nonlinear modelling of low-frequency dispersive effects in microwave electron devicesAntonio Raffo. PhD thesis, University of Ferrara, Italy, 2006. [doi]

Automated microwave-device characterization setup based on a technology-independent generalized bias systemPier Andrea Traverso, Antonio Raffo, Massimo Pirazzini, Alberto Santarelli, Fabio Filicori. tim, 55(4):1390-1396, 2006. [doi]

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