Hiroshi Yamamoto, Ken Kikuchi, Norihiko Ui, Kazutaka Inoue, Valeria Vadalà, Gianni Bosi, Antonio Raffo, Giorgio Vannini. Analysis of Gate-Voltage Clipping Behavior on Class-F and Inverse Class-F Amplifiers. In 2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), San Diego, CA, USA, October 15-17, 2018. pages 44-47, IEEE, 2018. [doi]
Abstract is missing.