Hiroshi Yamamoto, Ken Kikuchi, Norihiko Ui, Kazutaka Inoue, Valeria Vadalà, Gianni Bosi, Antonio Raffo, Giorgio Vannini. Analysis of Gate-Voltage Clipping Behavior on Class-F and Inverse Class-F Amplifiers. In 2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), San Diego, CA, USA, October 15-17, 2018. pages 44-47, IEEE, 2018. [doi]
@inproceedings{YamamotoKUIVBRV18,
title = {Analysis of Gate-Voltage Clipping Behavior on Class-F and Inverse Class-F Amplifiers},
author = {Hiroshi Yamamoto and Ken Kikuchi and Norihiko Ui and Kazutaka Inoue and Valeria Vadalà and Gianni Bosi and Antonio Raffo and Giorgio Vannini},
year = {2018},
doi = {10.1109/BCICTS.2018.8551045},
url = {https://doi.org/10.1109/BCICTS.2018.8551045},
researchr = {https://researchr.org/publication/YamamotoKUIVBRV18},
cites = {0},
citedby = {0},
pages = {44-47},
booktitle = {2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), San Diego, CA, USA, October 15-17, 2018},
publisher = {IEEE},
isbn = {978-1-5386-6502-2},
}