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J. M. Rafí, M. B. González, K. Takakura, I. Tsunoda, M. Yoneoka, O. Beldarrain, M. Zabala, F. Campabadal. 3 dielectrics of different thickness. Microelectronics Reliability, 53(9-11):1333-1337, 2013. [doi]
Abstract is missing.