Exploiting drain-erase scheme in ferroelectric FETs for logic-in-memory

Musaib Rafiq, Yogesh Singh Chauhan, Shubham Sahay. Exploiting drain-erase scheme in ferroelectric FETs for logic-in-memory. Neuromorph. Comput. Eng., 5(2):24007, 2025. [doi]

Abstract

Abstract is missing.