Sumbal Rafiq, André Ivanov, Sassan Tabatabaei, Michel Renovell. Testing for Floating Gates Defects in CMOS Circuits. In 7th Asian Test Symposium (ATS 98), 2-4 December 1998, Singapore. pages 228-236, IEEE Computer Society, 1998. [doi]
@inproceedings{RafiqITR98,
title = {Testing for Floating Gates Defects in CMOS Circuits},
author = {Sumbal Rafiq and André Ivanov and Sassan Tabatabaei and Michel Renovell},
year = {1998},
url = {http://csdl.computer.org/comp/proceedings/ats/1998/8277/00/82770228abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/RafiqITR98},
cites = {0},
citedby = {0},
pages = {228-236},
booktitle = {7th Asian Test Symposium (ATS 98), 2-4 December 1998, Singapore},
publisher = {IEEE Computer Society},
isbn = {0-8186-8277-9},
}