Michael R. P. Ragazzon, Jan Tommy Gravdahl, Kristin Ytterstad Pettersen, Arnfinn Aas Eielsen. Topography and force imaging in atomic force microscopy by state and parameter estimation. In American Control Conference, ACC 2015, Chicago, IL, USA, July 1-3, 2015. pages 3496-3502, IEEE, 2015. [doi]
Abstract is missing.