Easily-Verifiable Design of Non-Scan Sequential Machines for Conformance Checking

Habibur Rahaman, Santanu Chattopadhyay, Indranil Sengupta 0001, Debesh K. Das, Bhargab B. Bhattacharya. Easily-Verifiable Design of Non-Scan Sequential Machines for Conformance Checking. In 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems, VLSID 2022, Bangalore, India, February 26 - March 2, 2022. pages 246-251, IEEE, 2022. [doi]

@inproceedings{RahamanCSDB22,
  title = {Easily-Verifiable Design of Non-Scan Sequential Machines for Conformance Checking},
  author = {Habibur Rahaman and Santanu Chattopadhyay and Indranil Sengupta 0001 and Debesh K. Das and Bhargab B. Bhattacharya},
  year = {2022},
  doi = {10.1109/VLSID2022.2022.00055},
  url = {https://doi.org/10.1109/VLSID2022.2022.00055},
  researchr = {https://researchr.org/publication/RahamanCSDB22},
  cites = {0},
  citedby = {0},
  pages = {246-251},
  booktitle = {35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems, VLSID 2022, Bangalore, India, February 26 - March 2, 2022},
  publisher = {IEEE},
  isbn = {978-1-6654-8505-0},
}