Easily-Verifiable Design of Non-Scan Sequential Machines for Conformance Checking

Habibur Rahaman, Santanu Chattopadhyay, Indranil Sengupta 0001, Debesh K. Das, Bhargab B. Bhattacharya. Easily-Verifiable Design of Non-Scan Sequential Machines for Conformance Checking. In 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems, VLSID 2022, Bangalore, India, February 26 - March 2, 2022. pages 246-251, IEEE, 2022. [doi]

Abstract

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