Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya. Easily Testable Realization of GRM and ESOP Networks for Detecting Stuck-at and Bridging Faults. In 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India. pages 487-492, IEEE Computer Society, 2004. [doi]
@inproceedings{RahamanDB04:0,
title = {Easily Testable Realization of GRM and ESOP Networks for Detecting Stuck-at and Bridging Faults},
author = {Hafizur Rahaman and Debesh K. Das and Bhargab B. Bhattacharya},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/vlsid/2004/2072/00/20720487abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/RahamanDB04%3A0},
cites = {0},
citedby = {0},
pages = {487-492},
booktitle = {17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2072-3},
}