Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya. Easily Testable Realization of GRM and ESOP Networks for Detecting Stuck-at and Bridging Faults. In 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India. pages 487-492, IEEE Computer Society, 2004. [doi]
Abstract is missing.