An Adaptive BIST Design for Detecting Multiple Stuck-Open Faults in a CMOS Complex Cell

Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya. An Adaptive BIST Design for Detecting Multiple Stuck-Open Faults in a CMOS Complex Cell. IEEE T. Instrumentation and Measurement, 57(12):2838-2845, 2008. [doi]

Authors

Hafizur Rahaman

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Debesh K. Das

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Bhargab B. Bhattacharya

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