Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya. An Adaptive BIST Design for Detecting Multiple Stuck-Open Faults in a CMOS Complex Cell. IEEE T. Instrumentation and Measurement, 57(12):2838-2845, 2008. [doi]
@article{RahamanDB08,
title = {An Adaptive BIST Design for Detecting Multiple Stuck-Open Faults in a CMOS Complex Cell},
author = {Hafizur Rahaman and Debesh K. Das and Bhargab B. Bhattacharya},
year = {2008},
doi = {10.1109/TIM.2008.926414},
url = {http://dx.doi.org/10.1109/TIM.2008.926414},
tags = {source-to-source, design, open-source},
researchr = {https://researchr.org/publication/RahamanDB08},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {57},
number = {12},
pages = {2838-2845},
}