Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya. An Adaptive BIST Design for Detecting Multiple Stuck-Open Faults in a CMOS Complex Cell. IEEE T. Instrumentation and Measurement, 57(12):2838-2845, 2008. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: An Adaptive BIST to Detect Multiple Stuck-Open Faults in CMOS circuitsHafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya. aspdac 1999: 287 [doi] BIST Design for Detecting Multiple Stuck-Open Faults in CMOS Circuits Using Transition CountHafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya. jcst, 17(6):731-737, 2002. [doi] New BIST Techniques for Universal and Robust Testing of CMOS Stuck-Open FaultsDebesh Kumar Das, Susanta Chakraborty, Bhargab B. Bhattacharya. vlsid 1997: 303-309 [doi]
The following publications are possibly variants of this publication: