Transition Fault Testability in Bit Parallel Multipliers over GF(2^{m})

Hafizur Rahaman, Jimson Mathew, Biplab K. Sikdar, Dhiraj K. Pradhan. Transition Fault Testability in Bit Parallel Multipliers over GF(2^{m}). In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 422-430, IEEE Computer Society, 2007. [doi]

Abstract

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