Anand Kumar Rai, Harsha B. Variar, Mayank Shrivastava. Circuit Reliability of $\text{MoS}_{2}$ Channel Based 2D Transistors. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-4, IEEE, 2023. [doi]
Abstract is missing.