Jaan Raik, Anna Rannaste, Maksim Jenihhin, Taavi Viilukas, Raimund Ubar, Hideo Fujiwara. Constraint-Based Hierarchical Untestability Identification for Synchronous Sequential Circuits. In 16th European Test Symposium (ETS 2011), May 23-27, 2011, Trondheim, Norway. pages 147-152, IEEE Computer Society, 2011. [doi]
@inproceedings{RaikRJVUF11,
title = {Constraint-Based Hierarchical Untestability Identification for Synchronous Sequential Circuits},
author = {Jaan Raik and Anna Rannaste and Maksim Jenihhin and Taavi Viilukas and Raimund Ubar and Hideo Fujiwara},
year = {2011},
doi = {10.1109/ETS.2011.38},
url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2011.38},
tags = {rule-based, constraints},
researchr = {https://researchr.org/publication/RaikRJVUF11},
cites = {0},
citedby = {0},
pages = {147-152},
booktitle = {16th European Test Symposium (ETS 2011), May 23-27, 2011, Trondheim, Norway},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-4433-5},
}