Jaan Raik, Anna Rannaste, Maksim Jenihhin, Taavi Viilukas, Raimund Ubar, Hideo Fujiwara. Constraint-Based Hierarchical Untestability Identification for Synchronous Sequential Circuits. In 16th European Test Symposium (ETS 2011), May 23-27, 2011, Trondheim, Norway. pages 147-152, IEEE Computer Society, 2011. [doi]
Abstract is missing.