Jaan Raik, Raimund Ubar, Joachim Sudbrock, Wieslaw Kuzmicz, Witold A. Pleskacz. DOT: new deterministic defect-oriented ATPG tool. In 10th European Test Symposium (ETS 2005), May 22-25, 2005, Tallinn, Estonia. pages 96-101, IEEE, 2005. [doi]
@inproceedings{RaikUSKP05,
title = {DOT: new deterministic defect-oriented ATPG tool},
author = {Jaan Raik and Raimund Ubar and Joachim Sudbrock and Wieslaw Kuzmicz and Witold A. Pleskacz},
year = {2005},
doi = {10.1109/ETS.2005.15},
url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2005.15},
researchr = {https://researchr.org/publication/RaikUSKP05},
cites = {0},
citedby = {0},
pages = {96-101},
booktitle = {10th European Test Symposium (ETS 2005), May 22-25, 2005, Tallinn, Estonia},
publisher = {IEEE},
isbn = {0-7695-2341-2},
}