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DOT: new deterministic defect-oriented ATPG tool

Jaan Raik, Raimund Ubar, Joachim Sudbrock, Wieslaw Kuzmicz, Witold A. Pleskacz. DOT: new deterministic defect-oriented ATPG tool. In 10th European Test Symposium (ETS 2005), May 22-25, 2005, Tallinn, Estonia. pages 96-101, IEEE, 2005. [doi]

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