Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model - researchr publication authors

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Pascal Raiola, Dominik Erb, Sudhakar M. Reddy, Bernd Becker 0001. Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model. In 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, VLSID 2017, Hyderabad, India, January 7-11, 2017. pages 135-140, IEEE Computer Society, 2017. [doi]

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