Pascal Raiola, Dominik Erb, Sudhakar M. Reddy, Bernd Becker 0001. Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model. In 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, VLSID 2017, Hyderabad, India, January 7-11, 2017. pages 135-140, IEEE Computer Society, 2017. [doi]
@inproceedings{RaiolaER017,
title = {Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model},
author = {Pascal Raiola and Dominik Erb and Sudhakar M. Reddy and Bernd Becker 0001},
year = {2017},
doi = {10.1109/VLSID.2017.34},
url = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2017.34},
researchr = {https://researchr.org/publication/RaiolaER017},
cites = {0},
citedby = {0},
pages = {135-140},
booktitle = {30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, VLSID 2017, Hyderabad, India, January 7-11, 2017},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-5740-5},
}