Balwinder Raj, Jatin Mitra, Deepak Kumar Bihani, V. Rangharajan, Ashok K. Saxena, Sudeb Dasgupta. Process Variation Tolerant FinFET Based Robust Low Power SRAM Cell Design at 32 nm Technology. J. Low Power Electronics, 7(2):163-171, 2011. [doi]
No references recorded for this publication.
No citations of this publication recorded.