Noise margin, critical charge and power-delay tradeoffs for SRAM design - researchr publication authors

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Aravind Rajendran, Yuriy Shiyanovskii, Frank Wolff, Christos A. Papachristou. Noise margin, critical charge and power-delay tradeoffs for SRAM design. In 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece. pages 145-150, IEEE, 2011. [doi]

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