Aravind Rajendran, Yuriy Shiyanovskii, Frank Wolff, Christos A. Papachristou. Noise margin, critical charge and power-delay tradeoffs for SRAM design. In 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece. pages 145-150, IEEE, 2011. [doi]
@inproceedings{RajendranSWP11,
title = {Noise margin, critical charge and power-delay tradeoffs for SRAM design},
author = {Aravind Rajendran and Yuriy Shiyanovskii and Frank Wolff and Christos A. Papachristou},
year = {2011},
doi = {10.1109/IOLTS.2011.5993828},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2011.5993828},
tags = {design},
researchr = {https://researchr.org/publication/RajendranSWP11},
cites = {0},
citedby = {0},
pages = {145-150},
booktitle = {17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece},
publisher = {IEEE},
isbn = {978-1-4577-1053-7},
}