The Future of Design for Test and Silicon Lifecycle Management

Janusz Rajski, Vivek Chickermane, Jean-François Côté, Stephan Eggersglüß, Nilanjan Mukherjee 0001, Jerzy Tyszer. The Future of Design for Test and Silicon Lifecycle Management. IEEE Design & Test of Computers, 41(4):35-49, August 2024. [doi]

Abstract

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