Janusz Rajski, Nilanjan Mukherjee. Innovative practices session 11C: Advanced scan methodologies [3 presentations]. In 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. pages 1, IEEE, 2015. [doi]
@inproceedings{RajskiM15,
title = {Innovative practices session 11C: Advanced scan methodologies [3 presentations]},
author = {Janusz Rajski and Nilanjan Mukherjee},
year = {2015},
doi = {10.1109/VTS.2015.7116300},
url = {http://dx.doi.org/10.1109/VTS.2015.7116300},
researchr = {https://researchr.org/publication/RajskiM15},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015},
publisher = {IEEE},
isbn = {978-1-4799-7597-6},
}