Innovative practices session 11C: Advanced scan methodologies [3 presentations]

Janusz Rajski, Nilanjan Mukherjee. Innovative practices session 11C: Advanced scan methodologies [3 presentations]. In 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. pages 1, IEEE, 2015. [doi]

Abstract

Abstract is missing.