Janusz Rajski, Jerzy Tyszer. Test Data Compression and Compaction for Embedded Test of Nanometer Technology Designs. In 21st International Conference on Computer Design (ICCD 2003),VLSI in Computers and Processors, 13-15 October 2003, San Jose, CA, USA, Proceedings. pages 331, IEEE Computer Society, 2003. [doi]
@inproceedings{RajskiT03:0, title = {Test Data Compression and Compaction for Embedded Test of Nanometer Technology Designs}, author = {Janusz Rajski and Jerzy Tyszer}, year = {2003}, url = {http://csdl.computer.org/comp/proceedings/iccd/2003/2025/00/20250331abs.htm}, tags = {testing, data-flow}, researchr = {https://researchr.org/publication/RajskiT03%3A0}, cites = {0}, citedby = {0}, pages = {331}, booktitle = {21st International Conference on Computer Design (ICCD 2003),VLSI in Computers and Processors, 13-15 October 2003, San Jose, CA, USA, Proceedings}, publisher = {IEEE Computer Society}, isbn = {0-7695-2025-1}, }