Janusz Rajski, Jerzy Tyszer. Test Data Compression and Compaction for Embedded Test of Nanometer Technology Designs. In 21st International Conference on Computer Design (ICCD 2003),VLSI in Computers and Processors, 13-15 October 2003, San Jose, CA, USA, Proceedings. pages 331, IEEE Computer Society, 2003. [doi]
Abstract is missing.