Fault Diagnosis in Scan-Based BIST

Janusz Rajski, Jerzy Tyszer. Fault Diagnosis in Scan-Based BIST. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 894-902, IEEE Computer Society, 1997.

Authors

Janusz Rajski

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Jerzy Tyszer

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