Janusz Rajski, Jerzy Tyszer. Fault Diagnosis in Scan-Based BIST. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 894-902, IEEE Computer Society, 1997.
@inproceedings{RajskiT97, title = {Fault Diagnosis in Scan-Based BIST}, author = {Janusz Rajski and Jerzy Tyszer}, year = {1997}, tags = {rule-based}, researchr = {https://researchr.org/publication/RajskiT97}, cites = {0}, citedby = {0}, pages = {894-902}, booktitle = {Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997}, publisher = {IEEE Computer Society}, isbn = {0-7803-4209-7}, }