Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Benoit Nadeau-Dostie. Test generator with preselected toggling for low power built-in self-test. In 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012. pages 1-6, IEEE, 2012. [doi]
Abstract is missing.